Products
TYSTC
Characterization
|
---|
Routine in-house techniques available include ● Epitaxial layer thickness by FTIR ● Epitaxial layer doping by mercury probe CV ● Surface roughness by AFM ● Full-wafer inspection using KLA-Tencor CS ● Flatness Measurement by Tropel FlatMaster 200 ● Nomarski microscopy
|
[Close] |