Focus on silicon carbide epitaxial wafer for 12 years
Worlds leading silicon carbide epitaxial wafer manufacturers
National consultation hotline:0769-22891678
Current location:Home>>Detection Service of Metal Contamination>>Detection service of metal contamination on wafer surface

Detection service of metal contamination on wafer surface

TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.

Product introduction

Detection service of metal contamination on wafer surface


TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.


*ICP-MS:Inductively Coupled Plasma- Mass Spectrometer

icp03.jpg

Label:
Previous:none
Next:none

Online Service
Contact information

Hotline

0769-22891678

Working hours

Monday to Saturday

Service E-mail

enquiry@sicty.com

QR code
Online Service